Dr. Carrie Donley

Dr. Carrie Donley - Research Scientist

Carrie oversees the X-ray and ultraviolet photoelectron spectrometer (XPS and UPS) within CHASE.  She also works part time in CHANL and in that role oversees a number of other tools including the x-ray diffractometer (XRD), infrared microscope (FTIR), UV-Vis microspectrophotometer (MSP), atomic force microscope (AFM), and the nanoindenter.  Contact her with questions about any of these tools!